Linear Feedback Shift Register-Based Test Pattern Generators: A Comparative Study
Keywords:
Test Pattern Generator (TPG), Linear Feedback Shift Register (LFSR), Testing of Digital Circuits, Switching Activity, Random SequenceAbstract
Pseudo Random Number Generators are largely used in VLSI Architecture as Test Pattern Generators for testing of digital circuits in a BIST system. The test pattern sequence generated also finds applications in cryptography. It is thus require designing an effective test pattern generator which utilizes least hardware, dissipates lowest power and generates most random sequence. This paper attempts to compare a very few recent proposals where Linear Feedback Shift Register (LFSR) has been suitably modified to obtain an efficient architecture of a test pattern generator.
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