Study on VLSI Designing with Reference to Digital Circuit

Authors

  • Chandan Kumar, Prof. Satyarth Tiwari

Keywords:

VLSI Design, Digital Circuit, Linear Feedback Shift Register

Abstract

The LFSR is the main component of the prototype generator. The number of outputs of the LFSR should be the same as the number of inputs of the circuit under test. The output of prototyping is applied as input to the circuit under test. The output of the circuit under test is applied to the output feedback analyzer. The outputs for the corresponding test vector are stored in the output response parser. If the stored output and the output of the circuit under test are the same, the circuit is declared free of liability; otherwise, the circuit has some liability. Three LFSR-based prototyping breakthroughs are developed for testing automated paths. There are three standard paths, namely C432, S27, and C17, which are considered as test circuits. Xilinx ISE 8.2 is used for program development. The encoding of the LFSR and the circuit under test are developed in Xilinx programming. LFSR-based prototyping for the C432 standard circuit was developed in Xilinx ISE 8.2. In the C432 test, 50 liabilities are generated to check the performance of the circuit under test; all 50 liabilities are detected by the proposed algorithm, and its scope of liability is 100.00%.

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How to Cite

Chandan Kumar, Prof. Satyarth Tiwari. (2023). Study on VLSI Designing with Reference to Digital Circuit. International Journal of Research & Technology, 11(1), 25–29. Retrieved from https://ijrt.org/j/article/view/678

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