Optimization Accurcay of Predicting Software Defects using Ensemble Machine Learning
Keywords:
Software Defect Prediction, Ensemble Machine Learning, Optimization, Random Forest, Gradient Boosting, Software Quality AssuranceAbstract
Software defect prediction plays a vital role in improving software reliability and reducing development costs by identifying fault-prone modules before deployment. Traditional machine learning techniques such as Decision Trees, Support Vector Machines (SVM), and Naïve Bayes have been widely employed for defect prediction; however, their performance often varies due to the imbalance and complexity of software datasets. This study proposes an ensemble machine learning-based approach to enhance the prediction accuracy and robustness of software defect detection. Ensemble techniques such as Random Forest, Gradient Boosting, AdaBoost, and Voting Classifier are analyzed and optimized using hyperparameter tuning strategies to achieve the best predictive performance. Feature selection techniques are also integrated to minimize noise and computational complexity. Publicly available datasets such as NASA and PROMISE repositories are used for experimental validation. Performance metrics such as accuracy, precision, recall, F1-score, and AUC are used to evaluate model efficiency. The results demonstrate that ensemble learning models significantly outperform individual classifiers in terms of both accuracy and generalization. This research highlights the importance of hybrid ensemble approaches in achieving optimized defect prediction accuracy, contributing to reliable and cost-effective software development processes.
References
Iqra Mehmood, Sidra Shahid, Hameed Hussain, Inayat Khan, Shafiq Ahmad, Shahid Rahman, Najeeb Ullah and Shamsul Huda, “A Novel Approach to Improve Software Defect Prediction Accuracy Using Machine Learning”, IEEE Access 2023.
L.-Q. Chen, C. Wang, and S.-L. Song, ‘‘Software defect prediction based on nested-stacking and heterogeneous feature selection,’’ Complex Intell. Syst., vol. 8, no. 4, pp. 3333–3348, Aug. 2022
M. Pavana, L. Pushpa, and A. Parkavi, ‘‘Software fault prediction using machine learning algorithms,’’ in Proc. Int. Conf. Adv. Elect. Comput. Technol., 2022, pp. 185–197
A. Al-Nusirat, F. Hanandeh, M. K. Kharabsheh, M. Al-Ayyoub, and N. Al-Dhfairi, ‘‘Dynamic detection of software defects using supervised learning techniques,’’ Int. J. Commun. Netw. Inf. Secur., vol. 11, no. 1, pp. 185–191, Apr. 2022.
R. Bahaweres, F. Agustian, I. Hermadi, A. Suroso, and Y. Arkeman, ‘‘Software defect prediction using neural network basedSMOTE,’’ in Proc. 7th Int. Conf. Electr. Eng., Comput. Sci. Informat. (EECSI), Oct. 2020, pp. 71–76
N. Li, M. Shepperd, and Y. Guo, ‘‘A systematic review of unsupervised learning techniques for software defect prediction,’’ Inf. Softw. Technol., vol. 122, Jun. 2020, Art. no. 106287.
Y. Qiu, Y. Liu, A. Liu, J. Zhu, and J. Xu, ‘‘Automatic feature exploration and an application in defect prediction,’’ IEEE Access, vol. 7, pp. 112097–112112, 2019.
A. Alsaeedi and M. Z. Khan, ‘‘Software defect prediction using supervised machine learning and ensemble techniques: A comparative study,’’ J. Softw. Eng. Appl., vol. 12, no. 5, pp. 85–100, 2019.
C. Manjula and L. Florence, ‘‘Deep neural network based hybrid approach for software defect prediction using software metrics,’’ Cluster Comput., vol. 22, no. S4, pp. 9847–9863, Jul. 2019.
R. Jayanthi and L. Florence, ‘‘Software defect prediction techniques using metrics based on neural network classifier,’’ Cluster Comput., vol. 22, no. S1, pp. 77–88, Jan. 2019.
A. Hammouri, M. Hammad, M. Alnabhan, and F. Alsarayrah, ‘‘Software bug prediction using machine learning approach,’’ Int. J. Adv. Comput. Sci. Appl., vol. 9, no. 2, pp. 78–83, 2018.
N. Kalaivani and R. Beena, ‘‘Overview of software defect prediction using machine learning algorithms,’’ Int. J. Pure Appl. Math., vol. 118, pp. 3863–3873, Feb. 2018.
M. A. Memon, M.-U.-R. Magsi, M. Memon, and S. Hyder, ‘‘Defects prediction and prevention approaches for quality software development,’’ Int. J. Adv. Comput. Sci. Appl., vol. 9, no. 8, pp. 451–457, 2018.
E. Naresh and S. P. Shankar, ‘‘Comparative analysis of the various data mining techniques for defect prediction using the NASA MDP datasets for better quality of the software product,’’ Adv. Comput. Sci. Technol., vol. 10, no. 7, pp. 2005–2017, 2017.
D. Kumar and V. H. S. Shukla, ‘‘A defect prediction model for software product based on ANFIS,’’ Int. J. Sci. Res. Devices vol. 3, no. 10, pp. 1024–1028, 2016.
P. Mandal and A. S. Ami, ‘‘Selecting best attributes for software defect prediction,’’ in Proc. IEEE Int. WIE Conf. Electr. Comput. Eng., Dec. 2015, pp. 110–113.
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