Low Power and Radiation Tolerance System on Chip (Soc) Architecture

Authors

  • Misbah Husain, Prof Shivraj Singh

Keywords:

System-on-Chip (SoC), RISC-V RV32I, low-power design, selective TMR, SEC-DED ECC, fault injection, FPGA, radiation tolerance

Abstract

The design and assessment of a low-power, radiation-tolerant System-on-Chip (SoC) architecture appropriate for RTL-level VLSI implementation was the main goal of the current work. Instruction memory, ECC-protected data memory, a memory-mapped interface, UART, GPIO, timer, interrupt controller, watchdog timer, Power Management Unit (PMU), and Fault-Tolerance Controller (FTC) were all incorporated into a small 32-bit RV32I-compatible processing subsystem. Practical methods for FPGA-oriented RTL design featured peripheral sleep modes, operand isolation, synchronous clock-enable control, memory-enable management, and a decrease in pointless bus activity. Instead of using full-chip redundancy, radiation tolerance was added selectively. The provided dataset showed a 14.6% drop in dynamic power from 82.4 mW to 70.4 mW and a 9.1% decrease in overall power from 101.0 mW to 91.8 mW. LUT use rose from 4,920 to 6,835 and flip-flop usage from 3,280 to 4,725. The claimed maximum operational frequency dropped from 109.9 MHz for the baseline to 103.6 MHz, while the combined design remained above the selected 100 MHz threshold. There were 1,800 injected events in the specified RTL fault-injection campaign; 1,786 events were detected and 1,207 events were categorised as effectively mitigated, representing 99.2% detection and 67.1% successful mitigation.

References

A. P. Chandrakasan, S. Sheng, and R. W. Brodersen, "Low-power CMOS digital design," IEEE Journal of Solid-State Circuits, vol. 27, no. 4, pp. 473-484, Apr. 1992, doi: 10.1109/4.126534.

P. E. Dodd and L. W. Massengill, "Basic mechanisms and modeling of single-event upset in digital microelectronics," IEEE Transactions on Nuclear Science, vol. 50, no. 3, pp. 583-602, Jun. 2003, doi: 10.1109/TNS.2003.813129.

R. E. Lyons and W. Vanderkulk, "The use of triple-modular redundancy to improve computer reliability," IBM Journal of Research and Development, vol. 6, no. 2, pp. 200-209, Apr. 1962, doi: 10.1147/rd.62.0200.

RISC-V International, "The RISC-V Instruction Set Manual, Volume I: Unprivileged ISA, RV32I Base Integer Instruction Set, Version 2.1," RISC-V Ratified Specifications Library, 2024.

M.-C. Hsueh, T. K. Tsai, and R. K. Iyer, "Fault injection techniques and tools," Computer, vol. 30, no. 4, pp. 75-82, Apr. 1997, doi: 10.1109/2.585157.

AMD, "UltraFast Design Methodology Guide for FPGAs and SoCs (UG949): Gating the Clock Buffer," AMD Adaptive Computing Documentation, 2023.1, 2023.

AMD, "Vivado Design Suite User Guide: Power Analysis and Optimization (UG907)," AMD Adaptive Computing Documentation, 2026.1, 2026.

R. C. Baumann, "Radiation-induced soft errors in advanced semiconductor technologies," IEEE Transactions on Device and Materials Reliability, vol. 5, no. 3, pp. 305-316, Sep. 2005, doi: 10.1109/TDMR.2005.853449.

AMD, "Device Reliability Report (UG116), Rev. 10.20: SEU and Soft Error Rate Measurements," AMD Adaptive Computing Documentation, Jul. 2025.

AMD, "Soft Error Mitigation Controller v4.1 LogiCORE IP Product Guide (PG036)," AMD Adaptive Computing Documentation, Nov. 2023.

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How to Cite

Misbah Husain, Prof Shivraj Singh. (2026). Low Power and Radiation Tolerance System on Chip (Soc) Architecture. International Journal of Research & Technology, 14(3), 1181–1197. Retrieved from https://ijrt.org/j/article/view/1834

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