SHUBHAM MISHRA1, SATYARTH TIWARI. Linear Feedback Shift Register-Based Test Pattern Generators: A Comparative Study. International Journal of Research & Technology, [S. l.], v. 10, n. 3, p. 26–28, 2022. Disponível em: https://ijrt.org/j/article/view/330. Acesso em: 13 feb. 2026.