ISHRAT AFREEN, NARENDRA PARMAR, VISHAL SHRIVASTAVA, GAGAN SHARMA. Empirical Evaluation of Machine Learning Classifiers for Static Metric Software Defect Prediction. International Journal of Research & Technology, [S. l.], v. 14, n. 2, p. 1626–1632, 2026. Disponível em: https://ijrt.org/j/article/view/1503. Acesso em: 19 jun. 2026.